Unit tests for TWI driver.
Copyright (c) 2013-2018 Microchip Technology Inc. and its subsidiaries.
#include <asf.h>#include <conf_test.h>Functions | |
| int | main (void) |
| Run TWI unit tests. More... | |
TWI unit test functions | |
| static void | run_twi_master_send_test (const struct test_case *test) |
| This test sends a packet from the master, and checks that the sending happens without errors. Master is megaRF device and the slave is on board EEPROM.Configuring EEPROM as slave is not required. More... | |
| static void | run_twi_master_recv_test (const struct test_case *test) |
| This test requests previously sent packet to be sent from the slave, and checks that the correct packet is received by the master. Master is megaRF device and the slave is on board EEPROM.Configuring EEPROM as slave is not required. More... | |
TWI unit test definitions | |
| #define | TWI_MASTER &TWBR |
| TWI master module. More... | |
| #define | TWI_SPEED 125000 |
| TWI data transfer rate. More... | |
| #define | TWI_SLAVE_ADDR 0xA0 |
| TWI slave address. More... | |
| #define | SLAVE_MEM_ADDR 0x10 |
| TWI slave memeroy address. More... | |
| #define | SLAVE_MEM_ADDR_LENGTH TWI_SLAVE_ONE_BYTE_SIZE |
| TWI slave memeory address length. More... | |
| #define | PATTERN_TEST_LENGTH sizeof(test_pattern) |
| Test Pattern size. More... | |
| const uint8_t | test_pattern [] |
| Test Pattern. More... | |
| #define PATTERN_TEST_LENGTH sizeof(test_pattern) |
Test Pattern size.
Referenced by run_twi_master_recv_test(), and run_twi_master_send_test().
| #define SLAVE_MEM_ADDR 0x10 |
TWI slave memeroy address.
Referenced by run_twi_master_recv_test(), and run_twi_master_send_test().
| #define SLAVE_MEM_ADDR_LENGTH TWI_SLAVE_ONE_BYTE_SIZE |
TWI slave memeory address length.
Referenced by main(), run_twi_master_recv_test(), and run_twi_master_send_test().
| #define TWI_MASTER &TWBR |
TWI master module.
Referenced by run_twi_master_recv_test(), and run_twi_master_send_test().
| #define TWI_SLAVE_ADDR 0xA0 |
TWI slave address.
Referenced by run_twi_master_recv_test(), and run_twi_master_send_test().
| #define TWI_SPEED 125000 |
TWI data transfer rate.
Referenced by run_twi_master_recv_test(), and run_twi_master_send_test().
| int main | ( | void | ) |
Run TWI unit tests.
Main function.
Initializes the clock system, board and serial output, then sets up the TWI unit test suite and runs it.
The SAM3X_EK, SAM3X Arduino board and SAM4C_EK use two bytes length internal address EEPROM.
References usart_rs232_options::baudrate, board_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, NULL, run_twi_master_recv_test(), run_twi_master_send_test(), stdio_serial_init(), sysclk_init(), test_suite_run(), and usart_serial_options.
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static |
This test requests previously sent packet to be sent from the slave, and checks that the correct packet is received by the master. Master is megaRF device and the slave is on board EEPROM.Configuring EEPROM as slave is not required.
| test | Current test case. |
References twi_package_t::addr, twi_master_options_t::baud_reg, PATTERN_TEST_LENGTH, SLAVE_MEM_ADDR, SLAVE_MEM_ADDR_LENGTH, twi_master_options_t::speed, sysclk_enable_peripheral_clock(), sysclk_get_cpu_hz(), test_assert_true, test_pattern, TWI_CLOCK_RATE, TWI_MASTER, twi_master_init(), twi_master_read(), TWI_SLAVE_ADDR, and TWI_SPEED.
Referenced by main().
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static |
This test sends a packet from the master, and checks that the sending happens without errors. Master is megaRF device and the slave is on board EEPROM.Configuring EEPROM as slave is not required.
| test | Current test case. |
References twi_package_t::addr, twi_master_options_t::baud_reg, PATTERN_TEST_LENGTH, SLAVE_MEM_ADDR, SLAVE_MEM_ADDR_LENGTH, twi_master_options_t::speed, STATUS_OK, sysclk_enable_peripheral_clock(), sysclk_get_cpu_hz(), test_assert_true, test_pattern, TWI_CLOCK_RATE, TWI_MASTER, twi_master_init(), twi_master_write(), TWI_SLAVE_ADDR, and TWI_SPEED.
Referenced by main().
| const uint8_t test_pattern[] |
Test Pattern.
1.8.5