This module contains common functions for testing of External Bus Interface (EBI) and the setup of external RAM devices.
The functions tests for:
The test functions are meant for use with Test Suite Framework and require that the test data has been set to an initialized ebi_test_params struct.
Modules | |
| Related Project(s) | |
| In this section you can find all the projects related to the Common EBI test functions. | |
Data Structures | |
| struct | ebi_test_params |
| EBI test parameters. More... | |
Functions | |
| void | run_address_bus_test (const struct test_case *test) |
| Test the address bus. More... | |
| void | run_data_bus_test (const struct test_case *test) |
| Test the data bus. More... | |
| void | run_data_integrity_test (const struct test_case *test) |
| Test the data integrity. More... | |
Variables | |
| hugemem_ptr_t | ebi_test_params::base |
| uint32_t | ebi_test_params::size |
| void run_address_bus_test | ( | const struct test_case * | test | ) |
Test the address bus.
Tests the address bus for stuck and coupled lines.
The bytes at base and all power-of-two locations are initialized with the value 0x55 before any testing of the address bus is done.
The first test of the address bus is for lines that are stuck high. This is done by writing the value 0xAA to the base, then verifying that all power-of-two locations still contain 0x55.
The address bus is then checked for lines that are stuck low or coupled. The base location is reinitialized with the value 0x55 before this test. The value 0xAA is then temporarily written to the individual power-of-two locations while the content of the others (base and power-of-two) are verified to still contain 0x55.
| test | Current test case. |
References ebi_test_params::base, hugemem_read8(), hugemem_write8(), params, ebi_test_params::size, test_assert_true, and test_get_data().
Referenced by main().
| void run_data_bus_test | ( | const struct test_case * | test | ) |
Test the data bus.
Tests the data bus for stuck and coupled lines by writing and verifying bit patterns in RAM.
First, unique 32-bit patterns with a single set bit are written to successive locations in memory. These patterns are referred to as a walking 1 since the bit pattern is shifted by 1 position for each new memory location.
The patterns are then read back for verification, inverted and written back to the memory location – the memory locations now contain a walking 0. These patterns are read back again for verification.
| test | Current test case. |
References ebi_test_params::base, hugemem_read32(), hugemem_write32(), params, test_assert_true, and test_get_data().
Referenced by main().
| void run_data_integrity_test | ( | const struct test_case * | test | ) |
Test the data integrity.
Tests the integrity of the entire SDRAM by filling it a sequence of incrementing 32-bit values and then verifying its content. This is done in two passes, with an inversion of the content after the first pass of verification.
| test | Current test case. |
References ebi_test_params::base, hugemem_read32(), hugemem_write32(), params, ebi_test_params::size, test_assert_true, and test_get_data().
Referenced by main().
| hugemem_ptr_t ebi_test_params::base |
Referenced by run_address_bus_test(), run_data_bus_test(), and run_data_integrity_test().
| uint32_t ebi_test_params::size |
Referenced by run_address_bus_test(), and run_data_integrity_test().
1.8.5