AT25DFx SerialFlash Component Example.
Copyright (c) 2012-2018 Microchip Technology Inc. and its subsidiaries.
Macros | |
#define | AT25DFX_TEST_BLOCK_ADDR (0) |
Test block start address. More... | |
#define | AT25DFX_TEST_DATA_SIZE (1024) |
Test size. More... | |
Functions | |
int | main (void) |
Application entry point for AT25DFx example. More... | |
void | test_ko (void) |
Entry point when test is failed. More... | |
Variables | |
static uint8_t | ram_buff [AT25DFX_TEST_DATA_SIZE] |
RAM buffer used in this example. More... | |
#define AT25DFX_TEST_BLOCK_ADDR (0) |
Test block start address.
Referenced by main().
#define AT25DFX_TEST_DATA_SIZE (1024) |
Test size.
Referenced by main().
int main | ( | void | ) |
Application entry point for AT25DFx example.
References AT25_SUCCESS, AT25_TYPE_UNPROTECT, at25dfx_erase_block(), at25dfx_initialize(), at25dfx_mem_check(), at25dfx_protect_chip(), at25dfx_read(), at25dfx_set_mem_active(), AT25DFX_TEST_BLOCK_ADDR, AT25DFX_TEST_DATA_SIZE, at25dfx_write(), board_init(), ram_buff, sysclk_init(), and test_ko().
void test_ko | ( | void | ) |
Entry point when test is failed.
Referenced by main().
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static |
RAM buffer used in this example.
Referenced by main().