sam/drivers/eic/unit_tests/unit_tests.c File Reference

Unit tests for EIC driver.

Copyright (c) 2012-2018 Microchip Technology Inc. and its subsidiaries.

#include <board.h>
#include <sysclk.h>
#include "eic.h"
#include "ioport.h"
#include "delay.h"
#include <string.h>
#include <unit_test/suite.h>
#include <stdio_serial.h>
#include <conf_test.h>
#include <conf_board.h>

Functions
int	main (void)
	Run EIC driver unit tests. More...
static void	run_eic_test (const struct test_case *test)
	Test EIC. More...
static void	set_int_flag (void)
	Interrupt handler for EIC interrupt. More...

Variables
volatile uint8_t	intflag = 0

int main

(

void

)

Run EIC driver unit tests.

References uart_rs232_options::baudrate, board_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, NULL, run_eic_test(), stdio_serial_init(), sysclk_init(), test_suite_run(), and usart_serial_options.

static void run_eic_test ( const struct test_case *  test )

static

Test EIC.

Parameters

test	Current test case.

References delay_ms, eic_line_config::eic_async, EIC_ASYNCH_MODE, eic_line_config::eic_edge, EIC_EDGE_FALLING_EDGE, eic_enable(), eic_line_config::eic_filter, EIC_FILTER_DISABLED, eic_line_config::eic_level, EIC_LEVEL_LOW_LEVEL, eic_line_enable(), eic_line_set_callback(), eic_line_set_config(), eic_line_config::eic_mode, EIC_MODE_EDGE_TRIGGERED, intflag, IOPORT_DIR_OUTPUT, ioport_disable_pin(), IOPORT_PIN_LEVEL_HIGH, IOPORT_PIN_LEVEL_LOW, ioport_set_pin_dir(), ioport_set_pin_level(), ioport_set_pin_mode(), set_int_flag(), and test_assert_true.

Referenced by main().

static void set_int_flag ( void  )

static

Interrupt handler for EIC interrupt.

References eic_line_disable_interrupt(), eic_line_interrupt_is_pending(), and intflag.

Referenced by run_eic_test().

volatile uint8_t intflag = 0