Unit tests for Non Volatile Memory controller driver.

#include <stdint.h>
#include <stdbool.h>
#include <board.h>
#include <sysclk.h>
#include <nvm.h>
#include <string.h>
#include <unit_test/suite.h>
#include <stdio_serial.h>
#include <conf_test.h>

Macros
Device signature readout unit test macros
#define	CHIP_DEVID0 SIGNATURE_0
	Macro for device ID byte 0 in device header file. More...

#define	CHIP_DEVID1 SIGNATURE_1
	Macro for device ID byte 1 in device header file. More...

#define	CHIP_DEVID2 SIGNATURE_2
	Macro for device ID byte 2 in device header file. More...

EEPROM read/write access unit test macros
#define	EEPROM_ERASED 0xff
	Content of an erased EEPROM byte. More...

#define	TEST_ERASE_PAGE 2
	EEPROM page to use in erase test. More...

#define	TEST_WRITE_PAGE 1
	EEPROM page to use in write test. More...

#define	TEST_ATOMIC_WRITE_PAGE 2
	EEPROM page to use in atomic write test. More...

#define	TEST_SPLIT_WRITE_PAGE 3
	EEPROM page to use in split write test. More...

#define	TEST_ERASE_BYTES_PAGE_1 4
	EEPROM page 1 of 2 to use in erase byte test. More...

#define	TEST_ERASE_BYTES_PAGE_2 5
	EEPROM page 2 of 2 to use in erase byte test. More...

#define	TEST_READ_BUFFER_PAGE 6
	EEPROM page to use in read buffer test. More...

#define	TEST_WRITE_BUFFER_PAGE 7
	EEPROM page to use in write buffer test. More...

Functions
int	main (void)
	Run NVM driver unit tests. More...

Device signature readout unit test functions
static void	run_device_id_test (const struct test_case *test)
	Test device ID readout. More...

static void	run_device_serial_test (const struct test_case *test)
	Test device serial number readout. More...

EEPROM read/write access unit test functions
static void	run_eeprom_erase_test (const struct test_case *test)
	Test EEPROM erase. More...

static void	run_eeprom_write_test (const struct test_case *test)
	Test EEPROM write. More...

static void	run_eeprom_atomic_write_test (const struct test_case *test)
	Test EEPROM atomic write. More...

static void	run_eeprom_split_write_test (const struct test_case *test)
	Test EEPROM split write. More...

static void	run_eeprom_erase_byte_test (const struct test_case *test)
	Test EEPROM byte erase. More...

static void	run_eeprom_read_buffer_test (const struct test_case *test)
	Test EEPROM read buffer. More...

static void	run_eeprom_write_buffer_test (const struct test_case *test)
	Test EEPROM write buffer. More...

Helper functions and macros
#define	set_buffer(buffer, value) memset(buffer, value, sizeof(buffer))
	Set all bytes in buffer to value. More...

static bool	is_eeprom_page_equal_to_buffer (uint8_t page, uint8_t *buffer)
	Check if EEPROM page is equal to memory buffer. More...

#define CHIP_DEVID0 SIGNATURE_0

Macro for device ID byte 0 in device header file.

Referenced by run_device_id_test().

#define CHIP_DEVID1 SIGNATURE_1

Macro for device ID byte 1 in device header file.

Referenced by run_device_id_test().

#define CHIP_DEVID2 SIGNATURE_2

Macro for device ID byte 2 in device header file.

Referenced by run_device_id_test().

#define EEPROM_ERASED 0xff

Content of an erased EEPROM byte.

Referenced by run_eeprom_atomic_write_test(), run_eeprom_erase_byte_test(), run_eeprom_erase_test(), run_eeprom_read_buffer_test(), run_eeprom_split_write_test(), run_eeprom_write_buffer_test(), and run_eeprom_write_test().

#define set_buffer	(	buffer,
		value
	)	memset(buffer, value, sizeof(buffer))

Set all bytes in buffer to value.

Referenced by run_eeprom_atomic_write_test(), run_eeprom_erase_byte_test(), run_eeprom_erase_test(), run_eeprom_read_buffer_test(), run_eeprom_split_write_test(), run_eeprom_write_buffer_test(), and run_eeprom_write_test().

#define TEST_ATOMIC_WRITE_PAGE 2

EEPROM page to use in atomic write test.

Referenced by run_eeprom_atomic_write_test().

#define TEST_ERASE_BYTES_PAGE_1 4

EEPROM page 1 of 2 to use in erase byte test.

Referenced by run_eeprom_erase_byte_test().

#define TEST_ERASE_BYTES_PAGE_2 5

EEPROM page 2 of 2 to use in erase byte test.

Referenced by run_eeprom_erase_byte_test().

#define TEST_ERASE_PAGE 2

EEPROM page to use in erase test.

Referenced by run_eeprom_erase_test().

#define TEST_READ_BUFFER_PAGE 6

EEPROM page to use in read buffer test.

Referenced by run_eeprom_read_buffer_test().

#define TEST_SPLIT_WRITE_PAGE 3

EEPROM page to use in split write test.

Referenced by run_eeprom_split_write_test().

#define TEST_WRITE_BUFFER_PAGE 7

EEPROM page to use in write buffer test.

Referenced by run_eeprom_write_buffer_test().

#define TEST_WRITE_PAGE 1

EEPROM page to use in write test.

Referenced by run_eeprom_write_test().

static bool is_eeprom_page_equal_to_buffer	(	uint8_t	page,
		uint8_t *	buffer
	)

static

Check if EEPROM page is equal to memory buffer.

Referenced by run_eeprom_atomic_write_test(), run_eeprom_erase_byte_test(), run_eeprom_erase_test(), run_eeprom_read_buffer_test(), run_eeprom_split_write_test(), run_eeprom_write_buffer_test(), and run_eeprom_write_test().

int main ( void )

Run NVM driver unit tests.

References usart_rs232_options::baudrate, board_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, run_device_id_test(), run_device_serial_test(), run_eeprom_atomic_write_test(), run_eeprom_erase_byte_test(), run_eeprom_erase_test(), run_eeprom_read_buffer_test(), run_eeprom_split_write_test(), run_eeprom_write_buffer_test(), run_eeprom_write_test(), stdio_serial_init(), sysclk_init(), test_suite_run(), and usart_serial_options.

static void run_device_id_test ( const struct test_case * test )

static

Test device ID readout.

This test reads out the DEVIDn registers and compares their value with the expected device ID for the device for which the project was compiled.

Parameters

test	Current test case.

References CHIP_DEVID0, CHIP_DEVID1, CHIP_DEVID2, nvm_device_id::devid0, nvm_device_id::devid1, nvm_device_id::devid2, nvm_read_device_id(), and test_assert_true.

Referenced by main().

static void run_device_serial_test ( const struct test_case * test )

static

Test device serial number readout.

This test reads out the LOTNUMn, WAFNUM, COORDXn and COORDYn values from the device signature row and checks that they are not all 0xFF.

Parameters

test	Current test case.

References nvm_device_serial::byte, nvm_read_device_serial(), and test_assert_true.

Referenced by main().

static void run_eeprom_atomic_write_test ( const struct test_case * test )

static

Test EEPROM atomic write.

This test erases test page TEST_ATOMIC_WRITE_PAGE, then writes the first byte in the page buffer before flushing it – this byte should then not be written to the EEPROM – and writing different values to the two successive bytes. An atomic write is then executed before the write of the latter two bytes is verified.

Parameters

test	Current test case.

References EEPROM_ERASED, is_eeprom_page_equal_to_buffer(), nvm_eeprom_atomic_write_page(), nvm_eeprom_erase_page(), nvm_eeprom_flush_buffer(), nvm_eeprom_load_byte_to_buffer(), set_buffer, success, test_assert_true, and TEST_ATOMIC_WRITE_PAGE.

Referenced by main().

static void run_eeprom_erase_byte_test ( const struct test_case * test )

static

Test EEPROM byte erase.

This test writes two bytes to test pages TEST_ERASE_BYTES_PAGE_1 and TEST_ERASE_BYTES_PAGE_2, then tries to erase one of them in the first page before verifying the erase, then in all pages before verifying that the second page was also erased.

Parameters

test	Current test case.

References EEPROM_ERASED, is_eeprom_page_equal_to_buffer(), nvm_eeprom_erase_bytes_in_all_pages(), nvm_eeprom_erase_bytes_in_page(), nvm_eeprom_load_byte_to_buffer(), nvm_eeprom_write_byte(), set_buffer, success, test_assert_true, TEST_ERASE_BYTES_PAGE_1, and TEST_ERASE_BYTES_PAGE_2.

Referenced by main().

static void run_eeprom_erase_test ( const struct test_case * test )

static

Test EEPROM erase.

This test writes a single byte to test page TEST_ERASE_PAGE, then erases all pages and checks that the test page contains only EEPROM_ERASED.

Parameters

test	Current test case.

References EEPROM_ERASED, is_eeprom_page_equal_to_buffer(), nvm_eeprom_erase_all(), nvm_eeprom_write_byte(), set_buffer, success, test_assert_true, and TEST_ERASE_PAGE.

Referenced by main().

static void run_eeprom_read_buffer_test ( const struct test_case * test )

static

Test EEPROM read buffer.

This test erases test page TEST_READ_BUFFER_PAGE then writes four bytes to the test page and tries to read the entire page using nvm_eeprom_read_buffer. It then compares the read page with what's actually in the EEPROM page.

Parameters

test	Current test case.

References EEPROM_ERASED, is_eeprom_page_equal_to_buffer(), nvm_eeprom_erase_bytes_in_page(), nvm_eeprom_read_buffer(), nvm_eeprom_write_byte(), set_buffer, success, test_assert_true, and TEST_READ_BUFFER_PAGE.

Referenced by main().

static void run_eeprom_split_write_test ( const struct test_case * test )

static

Test EEPROM split write.

This test writes two bytes to test page TEST_SPLIT_WRITE_PAGE with an atomic write operation, then writes a third byte to the same page with a split write operation before verifying that the page contains all three bytes.

Parameters

test	Current test case.

References EEPROM_ERASED, is_eeprom_page_equal_to_buffer(), nvm_eeprom_atomic_write_page(), nvm_eeprom_load_byte_to_buffer(), nvm_eeprom_split_write_page(), set_buffer, success, test_assert_true, and TEST_SPLIT_WRITE_PAGE.

Referenced by main().

static void run_eeprom_write_buffer_test ( const struct test_case * test )

static

Test EEPROM write buffer.

This test erases test page TEST_WRITE_BUFFER_PAGE then writes a buffer to the test page, and then overwrites this with the another buffer and checks that the last buffer written is what the page is containing.

Parameters

test	Current test case.

References EEPROM_ERASED, is_eeprom_page_equal_to_buffer(), nvm_eeprom_erase_and_write_buffer(), nvm_eeprom_erase_bytes_in_page(), set_buffer, success, test_assert_true, and TEST_WRITE_BUFFER_PAGE.

Referenced by main().

static void run_eeprom_write_test ( const struct test_case * test )

static

Test EEPROM write.

This test erases test page TEST_WRITE_PAGE, then writes a single byte to it and verifies that the write succeeded.

Parameters

test	Current test case.

References EEPROM_ERASED, is_eeprom_page_equal_to_buffer(), nvm_eeprom_erase_page(), nvm_eeprom_write_byte(), set_buffer, success, test_assert_true, and TEST_WRITE_PAGE.

Referenced by main().

Microchip® Advanced Software Framework

Macros

Functions

Helper functions and macros