Unit Tests

Introduction

This documentation has been automatically generated, and documents the source code found in the Microchip Advanced Software Framework (ASF).

Unit-tests

	ADC unit tests on Xplain using DAC
	AES driver unit tests on XMEGA-A1 Xplained
	AT45DBX DataFlash unit tests for Xplain
	ATSHA204 Unit Tests
	Calendar service unit tests on Xplain
	DAC unit tests on Xplain using ADC
	DES driver unit tests on XMEGA A1 Xplained
	DMA unit tests for XMEGA A1 Xplained
	FatFS unit tests for XMEGA-A1 Xplained
	FIFO service unit tests on Xplain
	MEMBAG unit tests for XMEGA A1 Xplained
	NVM driver unit tests on Xplain
	Sensor Platform unit tests for XMEGA A1 Xplained
	SPI driver unit tests on Xplain
	TWI unit tests on Xplain
	Unit test for gfx_mono menu system on XMEGA-A1 Xplain
	Unit tests for EBI driver with SDRAM on Xplain
	Unit tests for EBI driver with SRAM on STK600
	Unit tests for graphical primitives on Xplain
	Unit tests for spinner widget on Xplain
	WDT driver unit tests on XMEGA-A1 Xplained
	XMEGA timeout service unit tests on XMEGA-A1 Xplained